Here, we present a numerical post-processing method for removing the effectof anti-symmetric residual aberrations in high-resolution transmission electronmicroscopy (HRTEM) images of weakly scattering 2D-objects. The method is basedon applying the same aberrations with the opposite phase to the Fouriertransform of the recorded image intensity and subsequently inverting theFourier transform. We present the theoretical justification of the method andits verification based on simulated images in the case of low-orderanti-symmetric aberrations. Ultimately the method is applied to experimentalhardware aberration-corrected HRTEM images of single-layer graphene and MoSe2resulting in images with strongly reduced residual low-order aberrations, andconsequently improved interpretability. Alternatively, this method can be usedto estimate by trial and error the residual anti-symmetric aberrations in HRTEMimages of weakly scattering objects.
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